期刊
NANOTECHNOLOGY
卷 19, 期 44, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/19/44/445706
关键词
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资金
- National Basic Research Programme of China [2007CB935400, 2006CB302700]
- National High Technology Development Programme of China [2008AA031402, 2006AA03Z360]
- Science and Technology Council of Shanghai [0752nm013, 07QA14065, 07SA08]
- National Nature Science Foundation of China [60776058]
A phase change memory cell with tungsten trioxide bottom heating layer/electrode is investigated. The crystalline tungsten trioxide heating layer promotes the temperature rise in the Ge2Sb2Te5 layer which causes the reduction in the reset voltage compared to a conventional phase change memory cell. Theoretical thermal simulation and calculation for the reset process are applied to understand the thermal effect of the tungsten trioxide heating layer/ electrode. The improvement in thermal efficiency of the PCM cell mainly originates from the low thermal conductivity of the crystalline tungsten trioxide material.
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