Study of the tunnelling initiated leakage current through the carbon nanotube embedded gate oxide in metal oxide semiconductor structures

标题
Study of the tunnelling initiated leakage current through the carbon nanotube embedded gate oxide in metal oxide semiconductor structures
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 19, Issue 25, Pages 255401
出版商
IOP Publishing
发表日期
2008-05-15
DOI
10.1088/0957-4484/19/25/255401

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