Inverting amplitude and phase to reconstruct tip–sample interaction forces in tapping mode atomic force microscopy

标题
Inverting amplitude and phase to reconstruct tip–sample interaction forces in tapping mode atomic force microscopy
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 19, Issue 37, Pages 375704
出版商
IOP Publishing
发表日期
2008-08-02
DOI
10.1088/0957-4484/19/37/375704

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