4.8 Article

Evolution of the Raman spectrum of graphene grown on copper upon oxidation of the substrate

期刊

NANO RESEARCH
卷 7, 期 11, 页码 1613-1622

出版社

TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-014-0521-0

关键词

Raman spectroscopy; light coupling; tensile strain; graphene; STM; STS; AFM

资金

  1. National Basic Research Program of China [2012CB921300]
  2. National Natural Science Foundation of China [11074005, 91021007]
  3. Chinese Ministry of Education
  4. National Science Foundation [DMR-1106225]
  5. Office of Naval Research
  6. Research Grant Council of Hong Kong SAR [623512, DAG12EG05]
  7. Direct For Mathematical & Physical Scien
  8. Division Of Materials Research [1106225] Funding Source: National Science Foundation

向作者/读者索取更多资源

Significant changes in the Raman spectrum of single-layer graphene grown on a copper film were observed after the spontaneous oxidation of the underlying substrate that occurred under ambient conditions. The frequencies of the graphene G and 2D Raman modes were found to undergo red shifts, while the intensities of the two bands change by more than an order of magnitude. To understand the origin of these effects, we further characterized the samples by scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS), and atomic force microscopy (AFM). The oxidation of the substrate produced an appreciable corrugation in the substrate without disrupting the crystalline order of the graphene overlayer and/or changing the carrier doping level. We explain the red shifts of the Raman frequencies in terms of tensile strain induced by corrugation of the graphene layer. The changes in Raman intensity with oxidation arise from the influence of the thin cuprous oxide film on the efficiency of light coupling with the graphene layer in the Raman scattering process.

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