Quantum-Dot Size and Thin-Film Dielectric Constant: Precision Measurement and Disparity with Simple Models

标题
Quantum-Dot Size and Thin-Film Dielectric Constant: Precision Measurement and Disparity with Simple Models
作者
关键词
-
出版物
NANO LETTERS
Volume 15, Issue 1, Pages 21-26
出版商
American Chemical Society (ACS)
发表日期
2014-12-23
DOI
10.1021/nl5024244

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