期刊
NANO LETTERS
卷 14, 期 4, 页码 1903-1908出版社
AMER CHEMICAL SOC
DOI: 10.1021/nl500564b
关键词
Three-dimensional imaging; photoluminescence; single dopant; atomic-resolution ADF STEM
类别
资金
- JSPS [25106006]
- U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division
- Australian Research Council [DP110101570]
- Office of Science of the U.S. Department of Energy [DE-AC02-05CH11231]
- Grants-in-Aid for Scientific Research [25106006] Funding Source: KAKEN
Materials properties, such as optical and electronic response, can be greatly enhanced by isolated single dopants. Determining the full three-dimensional single-dopant defect structure and spatial distribution is therefore critical to understanding and adequately tuning functional properties. Combining quantitative Z-contrast scanning transmission electron microscopy images with image simulations, we show the direct determination of the atomic-scale depth location of an optically active, single atom Ce dopant embedded within wurtzite-type AlN. The method represents a powerful new tool for reconstructing three-dimensional information from a single, two-dimensional image.
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