Direct Imaging of Free Carrier and Trap Carrier Motion in Silicon Nanowires by Spatially-Separated Femtosecond Pump–Probe Microscopy

标题
Direct Imaging of Free Carrier and Trap Carrier Motion in Silicon Nanowires by Spatially-Separated Femtosecond Pump–Probe Microscopy
作者
关键词
-
出版物
NANO LETTERS
Volume 13, Issue 3, Pages 1336-1340
出版商
American Chemical Society (ACS)
发表日期
2013-02-19
DOI
10.1021/nl400265b

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