From Light Microscopy to Analytical Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)/SEM in Biology: Fixed Coordinates, Flat Embedding, Absolute References

标题
From Light Microscopy to Analytical Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB)/SEM in Biology: Fixed Coordinates, Flat Embedding, Absolute References
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume -, Issue -, Pages 1-19
出版商
Cambridge University Press (CUP)
发表日期
2018-09-24
DOI
10.1017/s1431927618015015

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