Atomic-Resolution Study of Grain Boundaries in CdTe Using Scanning Transmission Electron Microscopy

标题
Atomic-Resolution Study of Grain Boundaries in CdTe Using Scanning Transmission Electron Microscopy
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 24, Issue S1, Pages 102-103
出版商
Cambridge University Press (CUP)
发表日期
2018-08-07
DOI
10.1017/s1431927618001009

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