Cs-Corrected Scanning Transmission Electron Microscopy Investigation of Dislocation Core Configurations at a SrTiO3/MgO Heterogeneous Interface

Practical and Reproducible Mapping of Strains in Si Devices Using Geometric Phase Analysis of Annular Dark-Field Images From Scanning Transmission Electron Microscopy

(2010) Jayhoon Chung et al.   IEEE ELECTRON DEVICE LETTERS

Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

(2010) S. Cazottes et al.   THIN SOLID FILMS

Structure-Property Relation of SrTiO3/LaAlO3Interfaces

(2009) Mark Huijben et al.   ADVANCED MATERIALS

SrTiO3 (001) ( × )R33.7° Surface Reconstruction

(2009) D Kienzle et al.   MICROSCOPY AND MICROANALYSIS

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

(2009) U. Dahmen et al.   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

Measurement of strain fields in an edge dislocation

(2009) Z.S. Dong et al.   PHYSICA B-CONDENSED MATTER

MATERIALS SCIENCE: Atomically Engineered Oxide Interfaces

(2009) J. W. Reiner et al.   SCIENCE

Aberration-corrected Z-contrast imaging of SrTiO3 dislocation cores

(2008) R. F. Klie et al.   Microscopy

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

(2008) C. Kisielowski et al.   MICROSCOPY AND MICROANALYSIS