Comparison of transient and static test methods for chip-to-sink thermal interface characterization

标题
Comparison of transient and static test methods for chip-to-sink thermal interface characterization
作者
关键词
-
出版物
MICROELECTRONICS JOURNAL
Volume 40, Issue 9, Pages 1379-1386
出版商
Elsevier BV
发表日期
2008-08-14
DOI
10.1016/j.mejo.2008.06.079

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