Effect of annealing on the structural, optical and electrical properties of ITO films by RF sputtering under low vacuum level

标题
Effect of annealing on the structural, optical and electrical properties of ITO films by RF sputtering under low vacuum level
作者
关键词
-
出版物
MICROELECTRONICS JOURNAL
Volume 39, Issue 12, Pages 1444-1451
出版商
Elsevier BV
发表日期
2008-07-30
DOI
10.1016/j.mejo.2008.06.081

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