Microscopy study of the conductive filament in HfO2 resistive switching memory devices

标题
Microscopy study of the conductive filament in HfO2 resistive switching memory devices
作者
关键词
-
出版物
MICROELECTRONIC ENGINEERING
Volume 109, Issue -, Pages 75-78
出版商
Elsevier BV
发表日期
2013-04-04
DOI
10.1016/j.mee.2013.03.145

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