Opportunities and challenges for Ge CMOS – Control of interfacing field on Ge is a key (Invited Paper)

标题
Opportunities and challenges for Ge CMOS – Control of interfacing field on Ge is a key (Invited Paper)
作者
关键词
-
出版物
MICROELECTRONIC ENGINEERING
Volume 86, Issue 7-9, Pages 1571-1576
出版商
Elsevier BV
发表日期
2009-03-17
DOI
10.1016/j.mee.2009.03.052

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