Frequency and gate voltage effects on the dielectric properties of Au/SiO2/n-Si structures

标题
Frequency and gate voltage effects on the dielectric properties of Au/SiO2/n-Si structures
作者
关键词
-
出版物
MICROELECTRONIC ENGINEERING
Volume 85, Issue 9, Pages 1910-1914
出版商
Elsevier BV
发表日期
2008-06-24
DOI
10.1016/j.mee.2008.06.009

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started