期刊
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
卷 149, 期 2, 页码 166-170出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.mseb.2007.11.030
关键词
EPSR; glass structure; neutron scattering; X-ray scattering; EXAFS
Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber-Ziman and Bhatia-Thornton partial structure factors and pair distribution functions that are extracted from the model. Crown Copyright (C) 2007 Published by Elsevier B.V. All rights reserved.
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