期刊
MATERIALS CHEMISTRY AND PHYSICS
卷 220, 期 -, 页码 433-440出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2018.09.002
关键词
-
资金
- Ministry of Science and Technology of Taiwan [MOST 105-2112-M-018-006]
The MoS2/ZnO and MoS2/Si heterojunction structures were fabricated by thermal evaporation and sol-gel methods. The crystal structures properties of MoS2/ZnO and MoS2/Si were characterized by X-ray diffraction (XRD) pattern, Raman spectroscopy, and transmission electron microscope (TEM). The XRD and Raman spectroscopy results indicate that the n-MoS2 film was successfully grown on p-doped ZnO or Si. The TEM images of MoS2/ZnO and MoS2/Si heterojunction structures shows the MoS2 stacking layer-by-layer covalented by van der Waals (vdW) force. The current-voltage (I-V) measurement shows the rectifying behavior of the heterojunction structures. The photoconductivity and photoresponsivity properties explore its carrier kinetic decay process. The results shows the potential applicability of MoS2/ZnO and MoS2/Si heterojunction structures as optoelectronic devices.
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