期刊
MATERIALS CHARACTERIZATION
卷 96, 期 -, 页码 158-165出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2014.08.003
关键词
Electron backscatter diffraction (EBSD); Thin plate spline (TPS); Electron channeling contrast (ECC); Transmission electron microscopy (TEM); Recrystallization
类别
资金
- Danish National Research Foundation [DNRF86-5]
- National Natural Science Foundation of China [51261130091]
Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps. (C) 2014 Elsevier Inc. All rights reserved.
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