Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

标题
Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials
作者
关键词
-
出版物
MATERIALS CHARACTERIZATION
Volume 85, Issue -, Pages 111-123
出版商
Elsevier BV
发表日期
2013-09-17
DOI
10.1016/j.matchar.2013.09.002

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