Fractal characterization of the silicon surfaces produced by ion beam irradiation of varying fluences

出版年份 2015 全文链接

标题

作者

关键词

Surface morphology, Atomic force microscopy, Autocorrelation function, Height–height correlation function, Fractal measures

出版物

APPLIED SURFACE SCIENCE

Volume 347, Issue -, Pages 706-712

出版商

Elsevier BV

发表日期

2015-05-02

DOI

10.1016/j.apsusc.2015.04.150

向作者/读者发起求助以获取更多资源

Protocol

在线求助

Reagent

在线求助

Reprint

联系作者

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started