On the Connection between Dielectric Breakdown Strength, Trapping of Charge, and Contact Angle Saturation in Electrowetting

标题
On the Connection between Dielectric Breakdown Strength, Trapping of Charge, and Contact Angle Saturation in Electrowetting
作者
关键词
-
出版物
LANGMUIR
Volume 25, Issue 1, Pages 147-152
出版商
American Chemical Society (ACS)
发表日期
2008-12-04
DOI
10.1021/la802551j

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started