Software defect prediction using cost-sensitive neural network

标题

作者

关键词

Machine learning, Software defect prediction, Artificial Neural Network, Artificial Bee Colony, Software quality, Cost-sensitive classification

出版物

Volume 33, Issue -, Pages 263-277

出版商

Elsevier BV

发表日期

2015-05-03

DOI

10.1016/j.asoc.2015.04.045

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