Hot-electron transport studies of the Ag/Si(001) interface using ballistic electron emission microscopy

标题
Hot-electron transport studies of the Ag/Si(001) interface using ballistic electron emission microscopy
作者
关键词
-
出版物
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Volume 28, Issue 4, Pages 643-646
出版商
American Vacuum Society
发表日期
2010-07-01
DOI
10.1116/1.3397795

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