High breakdown single-crystal GaN p-n diodes by molecular beam epitaxy

Molecular beam epitaxy grown GaN p-n vertical diodes are demonstrated on single-crystal GaN substrates. A low leakage current <3 nA/cm(2) is obtained with reverse bias voltage up to -20V. With a 400 nm thick n-drift region, an on-resistance of 0.23 m Omega cm(2) is achieved, with a breakdown voltage corresponding to a peak electric field of similar to 3.1 MV/cm in GaN. Single-crystal GaN substrates with very low dislocation densities enable the low leakage current and the high breakdown field in the diodes, showing significant potential for MBE growth to attain near-intrinsic performance when the density of dislocations is low. (C) 2015 AIP Publishing LLC.