Effect of source/drain overlap region on device performance in a-IGZO thin-film transistors

标题
Effect of source/drain overlap region on device performance in a-IGZO thin-film transistors
作者
关键词
-
出版物
出版商
Wiley
发表日期
2009-08-27
DOI
10.1889/jsid17.9.735

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now