Thickness Dependence of Properties of ZnO Thin Films on Porous Silicon Grown by Plasma-assisted Molecular Beam Epitaxy

标题
Thickness Dependence of Properties of ZnO Thin Films on Porous Silicon Grown by Plasma-assisted Molecular Beam Epitaxy
作者
关键词
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出版物
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume 59, Issue 3, Pages 2354-2361
出版商
Korean Physical Society
发表日期
2011-09-15
DOI
10.3938/jkps.59.2354

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