期刊
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
卷 57, 期 6, 页码 1416-1420出版社
KOREAN PHYSICAL SOC
DOI: 10.3938/jkps.57.1416
关键词
Polyaniline; Nanowire; Degradation; Coulombic repulsion
资金
- KRIBB Research Initiative
- Ministry of Education, Science and Technology [2009-0094032]
We studied the degradation properties of a conducing polyaniline (PANI) nanowire field-effect transistor (FET) operating in a three-probe FET structure in an electrolyte solution on a SiO(2)/Si substrate. We observed that the current-voltage characteristics of an electrolyte-gated PANI nanowire FET swept for 13 cycles in a cyclic potential mode exhibited clear irreversible degradation, as shown by the drain current-gate voltage curves. We propose that the degradation of the PANI nanowire FET, which indicates a conductance loss and gain in the oxidation and reduction modes, respectively, is attributable to the intensity of Coulombic repulsion in the cycle mode.
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