期刊
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
卷 132, 期 43, 页码 15167-15169出版社
AMER CHEMICAL SOC
DOI: 10.1021/ja105517d
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资金
- U.S. Department of Energy-Office of Basic Energy Sciences [DE-FG02-08ER1534]
- NSF [CHE-0809108]
- DOE Office of Basic Energy Sciences [DE-FG02-96ER45576]
- UCI Solar Energy Research Center
- U.S. Department of Energy (DOE) [DE-FG02-96ER45576] Funding Source: U.S. Department of Energy (DOE)
Single-molecule fluorescence microscopy provided information about the real-time distribution of chemical reactivity on silicon oxide supports at the solution surface interface, at a level of detail which would be unavailable from a traditional ensemble technique or from a technique that imaged the static physical properties of the surface. Chemical reactions on the surface were found to be uncorrelated; that is, the chemical reaction of one metal complex did not influence the location of a future chemical reaction of another metal complex.
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