Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector

出版年份 2011 全文链接

标题

Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector

作者

关键词

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出版物

JOURNAL OF SYNCHROTRON RADIATION

Volume 18, Issue 5, Pages 747-752

出版商

International Union of Crystallography (IUCr)

发表日期

2011-07-19

DOI

10.1107/s0909049511027531

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