Structural characterization of C–S–H and C–A–S–H samples—Part I: Long-range order investigated by Rietveld analyses

标题
Structural characterization of C–S–H and C–A–S–H samples—Part I: Long-range order investigated by Rietveld analyses
作者
关键词
-
出版物
JOURNAL OF SOLID STATE CHEMISTRY
Volume 182, Issue 12, Pages 3312-3319
出版商
Elsevier BV
发表日期
2009-10-01
DOI
10.1016/j.jssc.2009.09.026

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started