Method to deduce the critical size for interfacial delamination of patterned electrode structures and application to lithiation of thin-film silicon islands

标题
Method to deduce the critical size for interfacial delamination of patterned electrode structures and application to lithiation of thin-film silicon islands
作者
关键词
-
出版物
JOURNAL OF POWER SOURCES
Volume 206, Issue -, Pages 357-366
出版商
Elsevier BV
发表日期
2012-01-25
DOI
10.1016/j.jpowsour.2012.01.097

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