4.5 Article

Applicability of ground-penetrating radar as a tool for nondestructive soil-depth mapping on Pleistocene periglacial slope deposits

期刊

JOURNAL OF PLANT NUTRITION AND SOIL SCIENCE
卷 173, 期 2, 页码 173-184

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/jpln.200800163

关键词

GPR; PPSD; GPR facies; layer-based velocity calibration

资金

  1. German Research Foundation (DFG) [SFB 299]

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Soil depth plays a decisive role in determining soil properties in mountainous regions for ecological site assessment. To evaluate the use of ground-penetrating radar (GPR) for fast and high-resolution mapping within mountainous regions, we examined the possibilities and limitations of GPR to determine soil depth over bedrock and to delineate individual substrate layers formed during the Pleistocene in a periglacial environment (Pleistocene periglacial slope deposits, PPSD). Selected catenae in representative subregions of the study area (Dill catchment, SE Rhenish Massif, Germany) have been successfully mapped using GPR. A practicable method was developed using a 400 MHz antenna to reach a mean penetration depth of 1.5 m and to map different substrates and layers of PPSD based on calibrations of the GPR at soil pits along 12 catenae. Colluvium, the three types of PPSD layers, as well as the in situ bedrock could be distinguished in most sections of the GPR surveys. Characteristic GPR facies caused by intrinsic material properties of the different substrates, such as stone content and soil moisture content, could be distinguished in different geomorphologic and lithological settings. A layer-based velocity distribution was determined for characteristic substrate layers at soil pits enabling us to considerably enhance the accuracy of soil-depth prediction. Compared to traditionally surveyed soil profiles, our results demonstrate an accuracy of layer thickness surveying within a standard deviation of approx. 0.1 m. It is demonstrated that the combination of GPR with conventional soil-pit mapping is an efficient and valid method to produce high-resolution data of substrate distribution.

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