期刊
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
卷 74, 期 3, 页码 418-425出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.jpcs.2012.11.003
关键词
Thin films; X-ray diffraction; Defects; Electrical conductivity
Undoped and molybdenum doped zinc oxide (MZO) thin films were deposited on the glass substrate at a substrate temperature of 623 K by spray pyrolysis method. The effect of molybdenum (Mo) dopant concentration (0-4 at%) on the structural, morphological, optical and electrical properties of n-type MZO films was studied. The X-ray diffraction (XRD) results confirmed that the MZO thin films were polycrystalline with wurtzite structure. The scanning electron microscopy (SEM) measurements showed that the surface morphology of the films changes with Mo doping. The surface roughness of the films was investigated by atomic force microscopy (AFM). It was observed that the roughness of the films increases with the increase of Mo doping percentage. A blue shift of the optical band gap was observed. Room temperature photoluminescence (PL) measurement of the deposited films indicates the incorporation of Mo in ZnO lattice. The temperature dependence of the electrical conductivity was studied in the range of 300 K-425 K. At 2 at% Mo doping, the films have shown comparatively high electrical conductivity. (C) 2012 Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据