Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle
出版年份 2015 全文链接
标题
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 114, Issue 16, Pages -
出版商
American Physical Society (APS)
发表日期
2015-04-25
DOI
10.1103/physrevlett.114.166102
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM
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