Characterizing Atomic Composition and Dopant Distribution in Wide Band Gap Semiconductor Nanowires Using Laser-Assisted Atom Probe Tomography

标题
Characterizing Atomic Composition and Dopant Distribution in Wide Band Gap Semiconductor Nanowires Using Laser-Assisted Atom Probe Tomography
作者
关键词
-
出版物
Journal of Physical Chemistry C
Volume 115, Issue 36, Pages 17688-17694
出版商
American Chemical Society (ACS)
发表日期
2011-07-29
DOI
10.1021/jp2047823

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