Electron-Attachment-Induced DNA Damage: Instantaneous Strand Breaks

Low energy electron-attachment-induced damage in DNA, where dissociation channels may involve multiple bonds including complex bond rearrangements and significant nuclear motions, is analyzed here. Quantum mechanics/molecular mechanics (QM/MM) calculations reveal how rearrangements of electron density after vertical electron attachment modulate the position and dynamics of the atomic nuclei in DNA. The nuclear motions involve the elongation of the P-O (P-O-3' and P-O-5') and C-C (C-3'-C-4' and C-4'-O-5') bonds for which the acquired kinetic energy becomes high enough so that the neighboring C-3'-O-3' or C-5'-O-5' phosphodiester bond may break almost immediately. Such dynamic behavior should happen on a very short time scale, within 15-30 fs, which is of the same order of magnitude as the time scale predicted for the excess electron to localize around the nucleobases. This result indicates that the C-O phosphodiester bonds can break before electron transfer from the backbone to the base.