期刊
PHYSICA B-CONDENSED MATTER
卷 460, 期 -, 页码 196-198出版社
ELSEVIER
DOI: 10.1016/j.physb.2014.11.069
关键词
Raman spectroscopy; Thin films; Epitaxial strain; Rare-earth nickelates
资金
- German Science Foundation [TRR80]
In order to investigate the lattice dynamics of very thin films, we have carried out a series of depth-resolved Raman scattering measurements. Combining the narrow depth-of-field of confocal Raman spectroscopy with vertical scans of the sample, we have obtained high quality phonon spectra of fully strained LaNiO3 films with thickness as low as 4 pseudocubic unit cells. With increasing film thickness a large softening of a LaNiO3 E-g-bending mode is observed, indicating the relaxation of biaxial compressive strain imposed by the LaAlO3 substrate. (C) 2014 Elsevier B.V. All rights reserved,
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