A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

标题
A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions
作者
关键词
-
出版物
JOURNAL OF NANOPARTICLE RESEARCH
Volume 10, Issue S1, Pages 89-96
出版商
Springer Nature
发表日期
2008-06-19
DOI
10.1007/s11051-008-9435-7

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