Argon broad ion beam tomography in a cryogenic scanning electron microscope: a novel tool for the investigation of representative microstructures in sedimentary rocks containing pore fluid

标题
Argon broad ion beam tomography in a cryogenic scanning electron microscope: a novel tool for the investigation of representative microstructures in sedimentary rocks containing pore fluid
作者
关键词
-
出版物
JOURNAL OF MICROSCOPY
Volume 249, Issue 3, Pages 215-235
出版商
Wiley
发表日期
2013-01-17
DOI
10.1111/jmi.12011

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