Investigation of X-ray induced radiation damage at the Si-SiO2interface of silicon sensors for the European XFEL

标题
Investigation of X-ray induced radiation damage at the Si-SiO2interface of silicon sensors for the European XFEL
作者
关键词
-
出版物
Journal of Instrumentation
Volume 7, Issue 12, Pages C12012-C12012
出版商
IOP Publishing
发表日期
2012-12-12
DOI
10.1088/1748-0221/7/12/c12012

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