4.6 Article

Effect of structure and composition on optical properties of Er-Sc silicates prepared from multi-nanolayer films

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OPTICS EXPRESS
卷 23, 期 6, 页码 7021-7030

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OPTICAL SOC AMER
DOI: 10.1364/OE.23.007021

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  1. JSPS KAKENHI [24360033]

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Polycrystalline Er-Sc silicates (ErxSc(2-x)SiO(5) and ErxSc2-xSi2O7) were fabricated using multilayer nanostructured films of Er2O3/SiO2/Sc2O3 deposited on SiO2/Si substrates by RF-sputtering and thermal annealing at high temperature. RBS, TEM, GIXD, and PL results show the presence of ErxSc2-xSiO5 with an emission peak at 1528 nm for annealing from 900 to 1100 degrees C, and ErxSc2-xSi2O7 with an emission peak at 1537 nm for higher annealing temperature. The PL intensity of the ErxSc2-xSi2O7 phase is five times stronger than that of the ErxSc2-xSiO5 phase at 1250 degrees C. From PLE and PL spectra of ErxSc2-xSi2O7 thin film, we schematically illustrate the Er3+ Stark energy levels of I-4(13/2) to I-4(15/2) manifolds due to the crystal field strength effect of Sc3+. Temperature-dependent PL of the ErxSc2-xSi2O7 phase exhibits a variation of the full-width at half-maximum (FWHM) from 1.1 to 2.3 nm. The narrow FWHM is due to the small ionic radii of Sc3+, which enhance the crystal field strength affecting the optical properties of Er3+ ions located at the well-defined lattice sites of Sc silicate. A large excitation cross-section (sigma(ex)) is equal to 3.0x10(-20) cm(2) at lambda(ex) = 1527.6 nm. (C) 2015 Optical Society of America

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