期刊
OPTICAL MATERIALS
卷 46, 期 -, 页码 304-309出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2015.04.036
关键词
BaTiO3; Thin films; RF magnetron sputtering; Structural studies; XPS studies; Photoluminescence
The structural, optical and visible photoluminescence of the Erbium (Er) doped BaTiO3 (BT:Et) thin films were studied in terms of Er3+ substitutions for Ba and Ti sites with different Er3+ doping concentrations (0, 1,3 and 5 wt%). X-ray diffraction pattern of BT:Er:Er films with different Er3+ concentration showed tetragonal phase with preferred orientation along (101) plane. The lattice constant of BT:Er film of 1 wt% Er3+ shrank and then expanded for higher concentration. This indicates that Er3+ ions are completely incorporated into the host lattice by substituting for Ba2+ sites for 1 wt% Er3+ and then Ti4+ sites for higher Er3+ concentration in the BaTiO3 host. The crystallite size decreased for 1 wt% and then increased for higher Er (3 and 5 wt%) concentrations. The Scanning electron microscopy images revealed well patterned arrangement of larger spherical grains with neck formation. X-ray photoelectron spectroscopy analysis confirmed the presence of barium, titanium, erbium and oxygen in BT:Er films. An average transmittance >80% in visible region were observed for all the films. Optical band gap energy of BT:Er films were found to vary with increase in Er3+ concentration. The high refractive index >2 of these films can be used in optical application and anti-reflection coatings. Photoluminescence spectra of the films exhibited an increase in the emission intensity up to 3 wt% of Er3+ and then a decrease, due to self quenching. The improved optical properties of BT:Er films makes suitable for optical applications. (C) 2015 Elsevier B.V. All rights reserved.
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