期刊
JOURNAL OF ELECTRONIC MATERIALS
卷 40, 期 1, 页码 62-70出版社
SPRINGER
DOI: 10.1007/s11664-010-1386-y
关键词
Interfacial reaction; solidification; Sn; Bi; Co; size effect
资金
- National Science Council of Taiwan [NSC97-2221-E-007-067-MY3]
Solidification and interfacial reactions in Sn-57 wt.%Bi-(Co)/Cu couples are investigated. The addition of 0.05 wt.% Co and 0.5 wt.% Co and changes between 2 g and 20 mg solder sizes have no significant effects on the undercooling of Sn-57 wt.%Bi solders. Both eta-Cu(6)Sn(5) and epsilon-Cu(3)Sn phases are formed in Sn-57 wt.%Bi/Cu couples reacted at 80 degrees C, 100 degrees C, and 100 degrees C, whereas only eta-Cu(6)Sn(5) is formed at 160 degrees C. The formation of epsilon-Cu(3)Sn is suppressed and only eta-Cu(6)Sn(5) is found in the couple with 0.05 wt.% Co and 0.5 wt.% Co addition in Sn-57 wt.%Bi solder. Both the growth rate of eta-Cu(6)Sn(5) and the dissolution rate of the Cu substrate increase with Co addition. The morphology of eta-Cu(6)Sn(5) is also altered with Co addition, becoming a porous structure with solder trapped in the voids.
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