New image-quality measure based on wavelets

标题
New image-quality measure based on wavelets
作者
关键词
-
出版物
JOURNAL OF ELECTRONIC IMAGING
Volume 19, Issue 1, Pages 011018
出版商
SPIE-Intl Soc Optical Eng
发表日期
2010-01-26
DOI
10.1117/1.3293435

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now