期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 178, 期 -, 页码 186-194出版社
ELSEVIER
DOI: 10.1016/j.elspec.2009.06.008
关键词
Photoelectron diffraction; Surface structure; X-ray photoelectron diffraction (XPD); X-ray photoelectron spectroscopy (XPS)
类别
The coherent elastic scattering by surrounding atoms of a photoelectron wave field emitted from an atomic core level provides structural information on the environment of the emitter. This basic phenomenon leads to a range of interrelated methods, the information content of which depends on the photoelectron energy and the mode of detection (angle-scan or energy-scan). A short review is presented of these methods and their application to the investigation of atomic and molecular adsorbates and epitaxial films and particles, using both laboratory-based instrumentation and synchrotron radiation. (C) 2009 Elsevier B.V. All rights reserved.
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