Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

出版年份 2009 全文链接

标题

作者

关键词

出版物

Volume 178-179, Issue -, Pages 317-330

出版商

Elsevier BV

发表日期

2009-11-08

DOI

10.1016/j.elspec.2009.10.008

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