4.4 Article Proceedings Paper

Electron-carrier generation by edge dislocations in InN films: First-principles study

期刊

JOURNAL OF CRYSTAL GROWTH
卷 311, 期 10, 页码 2767-2771

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2009.01.019

关键词

Defects; Nitrides; Semiconducting indium compounds

向作者/读者索取更多资源

Electronic structures of edge dislocations in InN films are studied using the first-principles calculation. We found that dangling-bond states of In atoms localized in the dislocation core are located above the conduction-band bottom and thus supplies the electron carriers to the conduction band of bulk InN, in agreement with the experimental Suggestion by Wang et al. [Appl. Phys. Lett. 90 (2007) 151901]. Moreover, it is shown that the Fermi energy in the conduction band has the tendency to be pinned at the energy positions of N-related dangling-bond states. (C) 2009 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据