期刊
JOURNAL OF CRYSTAL GROWTH
卷 311, 期 9, 页码 2648-2654出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2009.03.006
关键词
Interface structure; Surface structure; Molecular beam epitaxy; Spinel; Oxide film growth
资金
- NSF [DMR 0520495, DMR 0705799]
- ONR
- U.S. Department of Energy Basic Energy Sciences [EFG02-98ER14882, DE-FG02-06ER15834]
The growth and characterization of epitaxial Co3O4(111) films grown by oxygen plasma-assisted molecular beam epitaxy on single crystal alpha-Al2O3(0001) is reported. The Co3O4(111) grows single crystalline with the epitaxial relation Co3O4(111)[(1) over bar2 (1) over bar]parallel to alpha-Al2O3(0001)[10 (1) over bar0], as determined from in situ electron diffraction. Film stoichiometry is confirmed by X-ray photoelectron spectroscopy, while ex situ X-ray diffraction measurements show that the Co3O4 films are fully relaxed. Post-growth annealing induces significant modifications in the film morphology, including a sharper Co3O4/alpha-Al2O3 interface and improved surface crystallinity, as shown by X-ray reflectometry, atomic force microscopy and electron diffraction measurements. Despite being polar, the surface of both as-grown and annealed Co3O4(111) films are (1 x 1), which can be explained in terms of a surface inversion in the spinel structure. (C) 2009 Elsevier B.V. All rights reserved.
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