Structural characterization of non-polar (1120) and semi-polar (1126) GaN films grown on r-plane sapphire

出版年份 2008 全文链接

标题

Structural characterization of non-polar (1120) and semi-polar (1126) GaN films grown on r-plane sapphire

作者

关键词

-

出版物

JOURNAL OF CRYSTAL GROWTH

Volume 310, Issue 12, Pages 2981-2986

出版商

Elsevier BV

发表日期

2008-03-13

DOI

10.1016/j.jcrysgro.2008.03.013

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Protocol

Reagent

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