4.4 Article

A detection system for charged-particle decay studies with a continuous-implantation method

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ELSEVIER
DOI: 10.1016/j.nima.2015.09.039

关键词

beta-delayed proton decay; Direct proton decay; Double-sided silicon strip detector; Continuous-beam mode; Implantation-decay correlation

资金

  1. National Basic Research Program of China [2013CB834404]
  2. National Natural Science Foundation of China [11375268, 11475263, U1432246, U1432127]

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A new detection system with high detection efficiency and low detection threshold has been developed for charged-particle decay studies, including beta-delayed proton, alpha decay or direct proton emission from proton-rich nuclei. The performance was evaluated by using the beta-delayed proton emitter Si-24 produced by projectile fragmentation at the First Radioactive Ion Beam Line in Lanzhou. Under a continuous-beam mode, the isotopes of interest were implanted into two double-sided silicon strip detectors, where the subsequent decays were measured and correlated to the preceding implantations by using position and time information. The system allows us to measure protons with energies down to about 200 keV without obvious 13 background in the proton spectrum. Further application of the detection system can be extended to the measurements of beta-delayed proton decay and the direct proton emission of more exotic proton-rich nuclei. (C) 2015 Elsevier B.V. All rights reserved.

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